Global Thin Film Metrology Systems Market 2015-2019 with KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies Dominating

DUBLIN, Feb .17, 2015 /PRNewswire/ --Research and Markets

(http://www.researchandmarkets.com/research/zmbvqd/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2015-2019" report to their offering.

The Global Thin-film Metrology Systems market will grow at a CAGR of 3.4% over the period 2014-2019

Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process.

According to the report, one of the main drivers of the market is the increased level of complexity in ICs. Over the years, the number of functions an IC has been able to do has increased considerably, resulting in the introduction of complex architectures such as 3D and FinFET. This is expected to foster the demand for thin film metrology systems as they are used in the manufacturing of complex semiconductor ICs.

Further, the report states that the cyclical nature of the semiconductor industry is one of the main challenges in the market. The revenue generated in the Semiconductor industry is cyclical in nature which acts as a major challenge for thin film metrology systems as they are dependent on the economic condition and the capital expenditure cycle of semiconductor manufacturers. Often production tends to exceed the demand during economic downturn, resulting in inventory pileup and, thus, low demand for semiconductor devices.

To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

• ODMs
• OEMs
• Foundries

Key Vendors

• KLA-Tencor
• Nanometrics
• Nova Measuring Instruments
• Rudolph Technologies

Other Prominent Vendors

• Hitachi High-Technologies
• SCREEN Holdings
• Semilab

Key Topics Covered:

1. Executive Summary
2. List of Abbreviations
3. Scope of the Report
4. Market Research Methodology
5. Introduction
6. Market Landscape
7. Geographical Segmentation
8. Buying Criteria
9. Market Growth Drivers
10. Drivers and their Impact
11. Market Challenges
12. Impact of Drivers and Challenges
13. Market Trends
14. Trends and their Impact
15. Vendor Landscape
16. Key Vendor Analysis

For more information visit http://www.researchandmarkets.com/research/zmbvqd/global_thin_film

Media Contact: Laura Wood , +353-1-481-1716, press@researchandmarkets.net

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